Abstract: Because of the special nonlinearity with inner states, memristors can induce the initial-condition-dependent extreme multistability in their constituent systems. However, when the memristor ...
Abstract: The reliability of wafer-level packaging (WLP) is critical in electronic packaging, and accelerated thermal cycling tests are widely used to evaluate it. However, these tests are ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results