Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect ...

AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

Researchers have developed a physics-based technique that accurately measures atomic-scale semiconductor defects, helping ...

Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...