PFM is based on the converse piezoelectric effect, where an applied electric field induces mechanical strain in piezoelectric materials. In PFM, an AC voltage is applied between a conductive atomic ...

What is Electrostatic Force Microscopy? Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

The word “piezo” derives from the Greek word piezein, meaning “to press tightly”. Piezoelectricity refers to a material’s ability to convert mechanical energy (pressing) into electric energy ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

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