Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot ...

Roboflow's workflow combines real and synthetic training data to develop defect detection models for manufacturing applications (Image: Roboflow) Roboflow integrates Nvidia simulation tools to train m ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Atomscale co-founder Chris Price explains how AI is moving from defect detector to design and optimization partner by reading ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...